Trazadores de curva / Parametrizadores

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    4200A-SCS Parameter Analyzer

    Up to 2X Faster Characterization Insight for Your Bold Discoveries
    The 4200A-SCS is a modular, customizable, and fully-integrated parameter analyzer that provides synchronized insight into current-voltage (I-V), capacitance-voltage (C-V), and ultra-fast pulsed I-V electrical characterization. Its optional 4200A-CVIV Multi-switch Module enables effortless switching between I-V and C-V measurements without re-cabling or lifting prober needles. The highest performance analyzer, the 4200A-SCS accelerates testing of complex devices for materials research, semiconductor device design, process development, or production.
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    Automated Characterization Suite (ACS) Software

    All-in-one solution: from test setup to analyzing results
    ACS is a flexible, interactive software test environment designed for semiconductor device characterization, reliability test, parametric test, and component functional test. ACS supports a wide range of Keithley instrumentation, as well as Keithley's S500 and S530 systems. Exceptional testing and analysis flexibility and an intuitive GUI make novice users productive almost immediately.
    • Intuitive GUI simplifies test plan development, test execution, and results analysis
    • Develop and execute tests at the device, site, wafer, and cassette level
    • Supports a wide range of instruments and system configurations including multi-SMU parallel test systems
    • Full control of semi-automatic and fully-automatic probers
    • Interactive and real-time data plotting
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    Parametric Test Systems S500

    Precise high speed measurements with automated probe stations
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    PCT Parametric Curve Tracer

    High Power Device Characterization
    Developing and using MOSFETS, IGBTs, diodes and other high power devices requires comprehensive device-level characterization such as breakdown voltage, on-state current and capacitance measurements. Keithley's line of high power Parametric Curve Tracer configurations supports the full spectrum of device types and test parameters. Keithley's Parametric Curve Tracer configurations include everything necessary for the characterization engineer to develop a complete test system quickly.

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